ABSTRACT
In Chapter 7 we discussed the current techniques to determine local orientations in an SEM. Compared with those methods, in particular EBSD, it turns out that TEMbased techniques can contribute most valuable information in cases where their much higher spatial resolution is a significant factor, such as where the diffraction volume elements are less than about 200nm in size (Case Studies No. S and 9). Furthermore, the TEM yields a wealth of concurrent information on the microstructure of the sample under investigation. e.g. on small precipitates, dislocation substructures and associated measurements, that cannot be obtained in the SE (Case Study No. 7).
