ABSTRACT
ABSTRACT: When a focussed electron beam passes close and parallel to a planar interface between two materials, a plasmon peak due to the interface is observed in the low-loss EELS spectrum. The properties of this interface plasmon are controlled by the dielectric functions of the two materials. This paper reports experimental measurements at the interface between Mg2Si and the matrix of a 6061 aluminium alloy. The results are compared to the predictions of the non-relativistic theory.
