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niques were prepared using pentane as the solvent. Similar methods were used in preparing calibration samples with the mold release, solder flux, and hydraulic oil samples. All contaminated coupons were gentl y heated in an oven at 50°C for several days to remove both semi-volatile and volatile components. This served to stabi-lize the contaminants, allowing for quantification by weighing. Once the weights became stable, the coupons were cooled and weighed to determine the amount of contaminant present on the surface. When not being weighed or examined, the coupons were kept in a desiccator. 3. RESULTS AND DISCUSSION Grazing-angle incidence reflectance spectroscopy acts to enhance the detection sensitivity for thin layers of residue predominantly through improved coupling of th e electric field intensity of the incident beam with the vibrating dipoles of the surface contaminant layer perpendicular to the metallic surface. Some additional enhancement of the infrared absorption spectrum will also occur due to a length-ening of the effective path length through the absorbing thin film layer [4-6]. If the optical properties of both thin film and substrate are known (or can be de-termined), the reflection-absorption spectrum can be calculated as a function of film thickness and angle of incidence. This capability is particularly useful for in-terpreting experimental data and designing optical instrumentation. Computer codes written at Sandia [7] performed these calculations for a variety of materials. 3.1. FTIR measurements FTIR reflectance data for the full drawing-agent sample set were obtained at NFESC and Sandia using angles of incidence of 75 and 60° for average film thickness ranging from 0.1 to 1 |im, and aluminum substrates with surface finish ranging from 600 to 80 grit. Since the surface finishing operation produced a highly directional roughness, measurements were made both longitudinally and transversely with respect to the polishing grooves. R values were determined at
DOI link for niques were prepared using pentane as the solvent. Similar methods were used in preparing calibration samples with the mold release, solder flux, and hydraulic oil samples. All contaminated coupons were gentl y heated in an oven at 50°C for several days to remove both semi-volatile and volatile components. This served to stabi-lize the contaminants, allowing for quantification by weighing. Once the weights became stable, the coupons were cooled and weighed to determine the amount of contaminant present on the surface. When not being weighed or examined, the coupons were kept in a desiccator. 3. RESULTS AND DISCUSSION Grazing-angle incidence reflectance spectroscopy acts to enhance the detection sensitivity for thin layers of residue predominantly through improved coupling of th e electric field intensity of the incident beam with the vibrating dipoles of the surface contaminant layer perpendicular to the metallic surface. Some additional enhancement of the infrared absorption spectrum will also occur due to a length-ening of the effective path length through the absorbing thin film layer [4-6]. If the optical properties of both thin film and substrate are known (or can be de-termined), the reflection-absorption spectrum can be calculated as a function of film thickness and angle of incidence. This capability is particularly useful for in-terpreting experimental data and designing optical instrumentation. Computer codes written at Sandia [7] performed these calculations for a variety of materials. 3.1. FTIR measurements FTIR reflectance data for the full drawing-agent sample set were obtained at NFESC and Sandia using angles of incidence of 75 and 60° for average film thickness ranging from 0.1 to 1 |im, and aluminum substrates with surface finish ranging from 600 to 80 grit. Since the surface finishing operation produced a highly directional roughness, measurements were made both longitudinally and transversely with respect to the polishing grooves. R values were determined at
niques were prepared using pentane as the solvent. Similar methods were used in preparing calibration samples with the mold release, solder flux, and hydraulic oil samples. All contaminated coupons were gentl y heated in an oven at 50°C for several days to remove both semi-volatile and volatile components. This served to stabi-lize the contaminants, allowing for quantification by weighing. Once the weights became stable, the coupons were cooled and weighed to determine the amount of contaminant present on the surface. When not being weighed or examined, the coupons were kept in a desiccator. 3. RESULTS AND DISCUSSION Grazing-angle incidence reflectance spectroscopy acts to enhance the detection sensitivity for thin layers of residue predominantly through improved coupling of th e electric field intensity of the incident beam with the vibrating dipoles of the surface contaminant layer perpendicular to the metallic surface. Some additional enhancement of the infrared absorption spectrum will also occur due to a length-ening of the effective path length through the absorbing thin film layer [4-6]. If the optical properties of both thin film and substrate are known (or can be de-termined), the reflection-absorption spectrum can be calculated as a function of film thickness and angle of incidence. This capability is particularly useful for in-terpreting experimental data and designing optical instrumentation. Computer codes written at Sandia [7] performed these calculations for a variety of materials. 3.1. FTIR measurements FTIR reflectance data for the full drawing-agent sample set were obtained at NFESC and Sandia using angles of incidence of 75 and 60° for average film thickness ranging from 0.1 to 1 |im, and aluminum substrates with surface finish ranging from 600 to 80 grit. Since the surface finishing operation produced a highly directional roughness, measurements were made both longitudinally and transversely with respect to the polishing grooves. R values were determined at
ABSTRACT
Optical constants (n and k) were derived for the contaminant C-H stretching vibrations using the Sandia reflectance code and a dispersion model to calculate a fit to the experimental data for one of the test coupons [7]. Reflectance-absorption spectra for the 2800-3000 cm'1 range were calculated for l-|Lim thick films of a specific hydrocarbon contaminant on an aluminum surface at either 60 or 75° angle of incidence. This function was then used as a linear variable in conjunction with a second-order polynomial to produce a least-squares fit of the experimental reflectance data for the test coupons. An example is shown in Figure 2 for the longitudinal measurements of three thicknesses of drawing-agent contaminant at
75° angle-of-incidence. This procedure produces extremely rapid, robust analyses of the FTIR reflectance data, even for very thin films in the presence of noise, and accounts for baseline shifts and curvature due to interference fringes.