ABSTRACT
Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, an
TABLE OF CONTENTS
chapter |5 pages
Accounting for the JKR-DMT transition in adhesion and measurements with atomic force microscopy
friction
chapter |5 pages
fits are not appropriate. transition fit most fit close
fits somewhat fit matches this
chapter |2 pages
losses in the underlying polymer et al. state that
tests using the surface force apparatus
chapter |6 pages
suggesting the absence of deformation of the interacting tip and
less reliable than that
chapter |4 pages
Adistribution of pull-off forces for
microspheres on a symmetrically structured rough surface
chapter |16 pages
Long-range attractive forces and energy barriers in de-inking flotation:
polyethylene and toner
chapter |20 pages
Atomic force microscopy, X-ray diffraction, X-ray photoelectron spectroscopy and thermal
of the new melamine fiber
chapter |23 pages
Morphology and elasticity of waterborne acrylic pressure-sensitive
with atomic force microscopy
chapter |12 pages
Determining the interphase thickness and properties in polymer matrix
force microscopy and nanoindentation
