ABSTRACT

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interfa

chapter 1|24 pages

2 Scattering in Bulk Matter

chapter 2|16 pages

.1

chapter 2|8 pages

.3 B

chapter 3|34 pages

Micro- and Nanodiffraction

chapter 4|1 pages

Small-Angle X-Ray Scattering

chapter 4|1 pages

1 Introduction

chapter 4|24 pages

2 Experimental Setup

chapter 4|14 pages

5 BioSAXS

chapter 6|3 pages

Inelastic X-Ray Scattering from Phonons

6.1 Introduction

chapter 6|27 pages

2 General F

chapter 7|30 pages

Magnetic X-Ray Scattering

chapter 8|4 pages

6 Conclusion and Outlook

chapter 9|2 pages

Reflectivity at Liquid Interfaces

chapter 9|3 pages

2X-Ray Reflectivity

chapter 9|7 pages

4 Roughness at Liquid Surfaces

chapter 9|14 pages

6 Instrumentation

9.6.1 Single-Crystal Liquid Diffractometer

chapter 10|17 pages

4 Summary

chapter 11|1 pages

Synchrotron Tomography

chapter 11|4 pages

1 Measurement Principle of Synchrotron Tom

chapter 11|21 pages

3 Ph

chapter 12|25 pages

Coherent X-Ray Diffraction Imaging of Nanostructures

12.1 Introduction

chapter 12|19 pages

3 Experimental Examples

12.3.1 Coherent X-Ray Imaging of Defects in Colloidal Crystals

chapter 13|36 pages

Ray Photon Correlation Spectroscopy

13.1 Introduction