ABSTRACT
As has been shown in Chapter 1, X-ray scattering and diffraction methods can be used to investigate microscopic properties of samples from micrometers size down to atomic distances. Therefore, X-ray scattering is frequently used by scientists and by industry and is very often the only available method. For good and reliable results an X-ray experiment must be performed very carefully. Most importantly, the X-ray beam has to be prepared in compliance with the needs of the experiment, which means one needs to tune the beam parameters by adequate choices of optics and X-ray sources. The instrument that is capable of tuning the X-ray beam parameters is called the beamline. The beam parameters of interest are the following: • F [cts/s] is the flux (or intensity).
