ABSTRACT
A metal-oxide-semiconductor (MOS) structure is fabricated by
growing a silicon dioxide (SiO2) layer on a silicon surface and
then depositing a metal (or poly-silicon) layer on top of that.
Together with p-n junctions, MOS structures have a particularly im-
portant role in semiconductor devices. A MOS structure is not only
a constituent of field effect transistors (FETs) but also a stand-alone
device (MOS capacitor) that is an essential tool for characterizing
semiconductor and insulator material properties.