ABSTRACT
Figure 5.1 Schematic illustration showing resolution of both microscopy and scattering methods. Abbreviations are as follows:
OM (optical microscopy), LSCM (laser scanning confocal microscopy), X-ray CT (X-ray computerized tomography), SEM (scanning electron microscope), TEMT (transmission electron microtomography), AFM (atomic force microscopy), WAXS (wide-angle X-ray scattering), SAXS (small-angle X-ray scattering), LS (light scattering), USAXS (ultrasmall-angle X-ray scattering), SANS (small-angle neutron scattering), and USANS (ultrasmall-angle neutron scattering). Methods shown by the bold arrows are 3D microscopy techniques. The shaded region represents the “missing spatial region” in 3D microscopy. Reprinted with permission from Ref. [1]. Copyright (2010) American Chemical Society.
