Statistical test planning using prior knowledge—advancing the approach of Beyer and Lauster

An approach is presented to include prior knowledge in the test planning of product reliability based on the approach of Beyer and Lauster (Beyer and Lauster, 1990) such that several and different sources of prior knowledge can be accounted for. Furthermore, this advanced approach is independent from Beyer/Lauster’s prerequisite that the confidence C of the prior knowledge in the form of R ₀(t) is to be at C = 63.2%. A nomogram is presented consistent with the pragmatic suggestions of Beyer/Lauster (Beyer and Lauster, 1990) yet extending the original version’s applicability. This paper provides a mathematically sound extension to the original paper broadening its applicability to more than one source of prior knowledge while liberating the constraint of C(R ₀(t)) = 63.2% while also allowing for a partial transfer of prior knowledge and accounting for accelerated lifetime tests.