ABSTRACT
By taking loading curves in a grid pattern over the surface, spatial maps of the variation in particle adhesion to a surface can be generated with a spatial resolution of less than 6 nanometers. This chapter describes the atomic force microscopy system and how it is used to take a loading curve. From the loading curve, the height of the surface and the adhesion of the particle to the surface can simultaneously be determined. The chapter discusses a novel combination of loading curves with spatial imaging. This combination allows one to map the spatial variations in adhesion with high resolution. Using this technique, one can directly measure the dependence of adhesion on surface roughness and material inhomogeneities. The chapter also discusses some observations that appear to measure the change in adhesion due to charge transfer, and presents some measurements showing that for some particles the adhesion depends on the applied loading force.
