Transmission Electron Microscopy of the Antiferroelectric – Ferroelectric Phase Boundary In PbZrO3-Based Compounds

Transmission electron microscopy and X-ray diffraction have been used to characterise the antiferroelectric (AFE) — ferroelectric phase (FE) boundary in PbZrO₃-based materials. Bulk ceramics in the solid solution (Pb_1-XBa_x)(Zr_1-xTi_x)O₃ (PBZT) and thin films of the general formula, Pb(Zr,Sn,Ti)_0.98Nb_0.02O₃ (PZSNT) were investigated. The phase changes in PBZT as a function of composition and temperature have been studied with a view to understanding the fundamental crystal chemistry across the AFE–FE phase boundary. PZSNT is a potential commercial composition which can be deposited as a thin film using sol-gel spinning. The crystallisation of thin PSZNT from the amorphous gel to the perovskite phase is discussed.