ABSTRACT
The Radiation Effects and Analysis Group (REAG) at NASA Goddard Space Flight Center submits for publication each year compendia for both single-event effects (SEE), and total ionizing dose (TID) and displacement damage (DD) to be published in the Data Workshop session of the Institute of Electrical and Electronics Engineers Nuclear and Space Radiation Effects Conference. Application-specific radiation testing is performed to establish the sensitivities of candidate spacecraft electronics as well as new electronic devices to heavy ion and proton-induced single event upset, single event latchup, and single event transients. Proton SEE tests performed by the REAG are conducted at a variety of facilities including the University of California at Davis Crocker Nuclear Laboratory, the Indiana University Cyclotron Facility. Proton SEE tests are performed in a manner similar to heavy ion exposures. The REAG has published yearly SEE, and TID and DD compendia containing test data on a variety of mainly commercial devices.
