ABSTRACT
94In order to study the effect of E x B and diamagnetic drift on cross-field plasma transport process, an experiment is carried out in double plasma device (DPD), and presented in this chapter. In the experimental configura- tion, the directions of both drifts are same and perpendicular to transverse magnetic field (TMF) as well as the DPD chamber axis. The TMF divides the plasma chamber into two distinct regions viz. source and target region on the basis of electron temperature. Plasma is produced in the source region by filament discharge method and then allowed to diffuse to the target region through the TMF. In order to study the electrically grounded and electrically biased side wall effect on different plasma parameters metallic plates are inserted in the TMF plane in a direction perpendicular to the TMF. Data are acquired by Langmuir probe and compared for dif- ferent source configuration in terms of metallic plate bias.
