chapter  Chapter 16
Modern Aspects of Technologies of Atomic Force Microscopy and Scanning Spectroscopy for Nanomaterials and Nanostructures Investigations and Characterizations
WithVictor A. Bykov, Arseny Kalinin, Vyatcheslav Polyakov, Artem Shelaev
Pages 8

New trends in development of scanning microscopy and atomic force microscopy are considered. Micro- and nanoelectronics with extra high-level metrology requirements and up to material science, biology, and ecology with requirements to the side of simplification in operation procedures, possibility of the materials and molecules recognitions are discussed. Perspective ways of nanoscale methods development are proposed.