ABSTRACT
In engineering and manufacturing environments, X-ray computed tomography (CT) as an imaging technology is increasingly used as a tool for fast product development, manufacturing process optimization, and quality assurance in the entire product lifecycle—from material characterization, component testing, and maintenance to recycling of the products. X-ray CT is a powerful and flexible imaging technology enabling non-destructive testing of manufactured parts and products within the entire product life cycle. The monitoring of CT scanners serves for long-term compliance with the metrological performance characteristics specified by the user or the CT manufacturer. The VDI/VDE guideline 2630-1.2 describes various quantities influencing the results of dimensional CT measurements being performed by industrial CT devices. It is important to know the influencing variables for, among others, the enhancement of accuracy and the optimal choice of parameters for CT measurements in order to minimize measurement uncertainty.
