ABSTRACT
We have used atomic force microscopy (AFM), and scanning tunneling microscopy (STM) to characterize the local surface electronic structure of several transition metal chalcogenides. The observed AFM and STM images are interpreted in terms of the structural and electronic properties of the surface and by calculating the total, p(r0), and partial electron density distribution, p(rQ, ef), respectively. The influence of local surface defects and edge planes on the observed surface electronic structure is also described. The possible implications of these findings on the chemical properties of these materials will be discussed.
