ABSTRACT
Atomic force microscopy (AFM) was invented in the 1980s [4] as a technique for imaging surface topography from micrometer to nanometer length scales. At the same time, A F M allows one to measure forces, precisely and accurately, in gaseous and various liquid media, and at controlled temperatures. Thus, A F M is an excellent method to characterize surface topography of various surfaces and to quantitatively study microparticle adhesion forces for these surfaces. In this paper we first review the theoretical and experimental basics of this approach and then review selected papers to illustrate the added value of A F M investigations when applied to particle adhesion. We complement this review with original results obtained in our laboratory for the adhesion of photocopy toner and silica particles on silicon substrates.
