ABSTRACT
Applications of full-field optical coherence tomography (FF-OCT)
outside the biomedical field are the topic of this chapter. Since its
introduction and based on the original motivation of the underlying
white-light interferometry technique in microelectronic inspection
tasks, FF-OCT is continuously gaining impetus for the characteriza-
tion of materials and for the evaluation of technical structures in
a nondestructive way. Examples, from the measurement of surface
topography and of layer thicknesses to a full three-dimensional
evaluation of internal structures within scattering media, are given
together with novel and advanced concepts for functional imaging.
