"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

chapter X|94 pages

X-ray Physics

ByAndrzej A. Markowicz

chapter 2|104 pages

Wavelength-Dispersive X-ray Fluorescence

ByJozef A. Helsen, Andrzej Kuczumow

chapter 4|102 pages

Spectrum Evaluation

ByPiet Van Espen

chapter 5|66 pages

Quantification of Infinitely Thick Specimens by XRF Analysis

ByJohan L. de Vries and Bruno A. R. Vrebos

chapter 6|26 pages

Quantification in XRF Analysis of Intermediate-Thickness Samples

ByAndrzej A. Markowicz and Rene´ E. Van Grieken

chapter 7|68 pages

Radioisotope-Excited X-ray Analysis

ByStanislaw Piorek

chapter 8|58 pages

Synchrotron Radiation-Induced X-ray Emission

ByKeith W. Jones

chapter 9|44 pages

Total Reflection X-ray Fluorescence

ByPeter Kregsamer, Christina Streli, Peter Wobrauschek

chapter 10|28 pages

Polarized Beam X-ray Fluorescence Analysis

ByJoachim Heckel, Richard W. Ryon

chapter 11|88 pages

Microbeam XRF

ByAnders Rindby, Koen H. A. Janssens

chapter 12|92 pages

Particle-Induced X-ray Emission Analysis

ByWilly Maenhaut, Klas G. Malmqvist

chapter 13|122 pages

Electron-Induced X-ray Emission

ByJohn A. Small, Dale E. Newbury, John T. Armstrong

chapter 14|44 pages

Sample Preparation for X-ray Fluorescence

ByMartina Schmeling and Rene´ E. Van Grieken