ABSTRACT

Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, Microscopy of Semiconducting Materials focuses on international developments in semiconductor studies carried out by all forms of microscopy. It provides an overview of the latest instrumentation, analysis techniques, and state-of-the-art advances in semiconducting materials science for solid state physicists, chemists, and material scientists.

part |82 pages

High Resolution Microscopy and Microanalysis

part |92 pages

Self-Organised and Quantum Domain Structures

part |94 pages

Epitaxy – Growth Phenomena

part |95 pages

Epitaxy – Wide Band-Gap Nitrides

part |90 pages

Processed Silicon and Other Device Materials

part |69 pages

Metallization, Silicides and Contacts

part |35 pages

Device Studies

part |110 pages

Scanning Electron and Ion Advances

part |40 pages

Scanning Probe Microscopy