ABSTRACT
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
TABLE OF CONTENTS
section Section 1|34 pages
Plenary lectures
section Section 2|60 pages
New instrumentation and election optics
section Section 3|34 pages
High resolution electron microscopy
section Section 4|20 pages
Electron crystallography
section Section 5|46 pages
Quantitative electron scattering
section Section 6|26 pages
Advanced scanning probe techniques
section Section 7|48 pages
Advanced scanning electron microscopy and surface science
section Section 8|110 pages
Microannalysis and EELS
section Section 9|28 pages
Catalysts
section Section 10|50 pages
Semiconductros and superconductors
section Section 11|78 pages
Ceramics and interfaces
section Section 12|46 pages
Intermetallics
section Section 13|92 pages
General materials analysis