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      Book

      Random Testing of Digital Circuits
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      Book

      Random Testing of Digital Circuits

      DOI link for Random Testing of Digital Circuits

      Random Testing of Digital Circuits book

      Theory and Applications

      Random Testing of Digital Circuits

      DOI link for Random Testing of Digital Circuits

      Random Testing of Digital Circuits book

      Theory and Applications
      ByRené David
      Edition 1st Edition
      First Published 1998
      eBook Published 26 November 2020
      Pub. Location Boca Raton
      Imprint CRC Press
      DOI https://doi.org/10.1201/9781003064718
      Pages 496
      eBook ISBN 9781003064718
      Subjects Engineering & Technology
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      Get Citation

      David, R. (1998). Random Testing of Digital Circuits: Theory and Applications (1st ed.). CRC Press. https://doi.org/10.1201/9781003064718

      ABSTRACT

      "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

      TABLE OF CONTENTS

      chapter 1|14 pages

      Random Testing and Built-In Self-Test

      chapter 2|26 pages

      Models for Digital Circuits and Fault Models

      chapter 3|41 pages

      Basic Concepts and Test Generation Methods

      chapter 4|24 pages

      Performance Measurements for a Test Sequence

      chapter 5|27 pages

      Basic Principles of Random Testing

      chapter 6|31 pages

      Random Test Length for Combinational Circuits

      chapter 7|25 pages

      Random Test Length for Sequential Circuits

      chapter 8|28 pages

      Random Test Length for RAMs

      chapter 9|27 pages

      Random Test Length for Microprocessors

      chapter 10|28 pages

      Generation of Random Test Sequences

      chapter 11|21 pages

      Experimental Results

      chapter 12|37 pages

      Signature Analysis

      chapter 13|15 pages

      Design For Random Testability

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