ABSTRACT
This book addresses the problem of treating interior responses of complex electronic enclosures or systems, and presents a probabilistic approach. Relationships for determining the statistics of the driving fields to apply to a circuit analysis code representing part of an enclosed system's writing are worked out. Also addressed are limited spatial and frequency coherence essential to a statistically based field drive model. This text gives examples, different modeling, and describes how to make, interchange, and optimize models.
TABLE OF CONTENTS
part I|266 pages
The Development and use of Statistical Electromagnetics (Stem)
chapter Chapter 3|43 pages
Distribution and Autocorrelation of Internal Fields; The Chi Square Distribution
chapter Chapter 7|30 pages
Field-Test Checkout Of Stem-Based Cable-Current Models; Summary And Evaluation Of Stem’S Cutting Edge
part II|142 pages
Information Presented to Assist the user of statistical electromagnetics (Stem)