ABSTRACT
This volume documents the proceedings of the 8th International Symposium on Particles on Surfaces: Detection, Adhesion and Removal held in Providence, Rhode Island, June 24a 26, 2002. The study of particles on surfaces is extremely crucial in a host of diverse technological areas, ranging from microelectronics to optics to biomedical. In a world o
TABLE OF CONTENTS
part |2 pages
Part 1: Particle Analysis / Characterization and General Cleaning-Related Topics
part |2 pages
Part 2: Particle Adhesion and Removal
