ABSTRACT
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interfa
TABLE OF CONTENTS
chapter 12|19 pages
3 Experimental Examples
12.3.1 Coherent X-Ray Imaging of Defects in Colloidal Crystals