ABSTRACT
ABSTRACT In this chapter the ultrahigh vacuum-based spectroscopies x-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), Auger electron spectroscopy (AES), and ion scattering spectroscopy (ISS) are introduced. The relative merits of these techniques, which can only be used in ex situ experiments, are discussed. Three illustrative examples demonstrate the broad applicability of XPS, UPS, and ISS and especially of their combination: characterization of the emersion process of Sn and Pt-Sn electrodes from sulfuric acid, determination of the structure of Cd underpotential deposition layers on Cu(111), and the correlation of spectroscopic surface composition data with the electrocatalytic CO oxidation rate on Pt-Ru electrodes.
