ABSTRACT
The exponential distribution plays an important role in the field of reliability. Justifications for using the exponential assumption in reliability applications can be found in the early works of D. J. Davis, and B. Epstein and M. Sobel. In the form of theoretical arguments supporting the use of the exponential distribution as the failure law of complex equipment, can be found in books by R. E. Barlow and F. Proschan. The no memory property uniquely characterizes the one-parameter exponential model within the class of continuous life-models, and it provides a rationale for its use in situations where wearout is not a factor. One such example is an electronic component which does not wear out, but fails due to a random shock such as a power surge. Although the constant hazard property appears to be a less global property than the no memory property, it also uniquely characterizes the one-parameter exponential model within the class of continuous life-models.
