ABSTRACT
We present the results of an investigation of the use of X-ray Photoelectron Spectroscopy (XPS) as a tool for the rapid characterisation of glass fibre coatings. XPS data have been obtained from a wide range of commercial and experimental glass fibres using three different XPS instruments. By developing a protocol to plot ratios of appropriate atom concentrations, XPS analysis has been shown to give new insights into the in situ nature of the coating on glass. We show how these plots of atom ratios can be used to estimate the surface coverage of the coating on the glass fibres and obtain information on the chemical composition of the coating. In comparing data from three XPS instruments excellent correlation was obtained after correcting for differences in spectrometer sensitivity factors. Relationships between the XPS data and coated glass fibre parameters are clarified with the aid of a patchy overlayer model. Results generated using this model are in good agreement with previously published data. We show that using this model XPS results combined with the results of ‘loss on ignition’ measurements gives a quantitative value for the coverage of the fibre surface by the sizing. The use of the model is illustrated by analysis of previously published XPS data from glass fibres.
