ABSTRACT
The purpose of research on a metal (M) deposited onto self-assembled monolayers (SAMs) is to understand the interactions between the metal and eventually metal oxide overlayers on well-ordered organic surfaces. Applications of M/SAM and inorganic/SAM research results to the understanding of real inorganic/organic interfaces in vacuum and under environmental conditions can potentially play a key role in the development of advanced devices with stable interfacial properties. The results of M/SAM studies to date are reviewed and M/SAM combinations ranked according to reactivity and penetration. As a set of specific examples, X-ray photoelectron spectroscopy (XPS) is used to identify the chemical shifts from species formed at M/SAM interfaces after evaporation of up to 1.0 nm of Cr overlayers on the CH3, CN, COOH, and COOCH3 end groups of appropriate SAMs on Au. The reactivity of Cr promotes growth of relatively smooth Cr layers without detectable penetration of the SAM. Chemical bonds are formed with carbon, nitrogen, and oxygen, which will enhance adhesion at Cr/polymer interfaces for polymers with the organic functional groups studied. The XPS spectra show intensities of carbide-and/or oxide-like species on the different end groups, all of which should enhance adhesion at the interface.
