ABSTRACT
This chapter discusses flight-qualification methodologies at the component and subsystem level, including both the optical and the optoelectronic assemblies. Topics addressed include qualification per Military (MIL), Telcordia, NASA, and IEEE standards. Test and characterization methodology topic include mechanical vibrations and shock, electromagnetic compatibility and interference, thermal vacuum stability and outgassing, static charge and electrostatic discharge (ESD) sensitivity, metal migration and whisker growth, nondestructive interference and cosmic background radiation. Steps involved in the qualification of custom off-the-shelf (COTS) components, qualification of discrete devices including both actives and passives, radiation-induced effects on optics, semiconductors and optoelectronics (e.g., photodetectors and lasers), accelerated life-testing and qualification examples are also described in this chapter.
