ABSTRACT
This chapter provides a timely overview of the application of resonant and polarized soft X-ray scattering in polymer electronics to date. It reviews the basic principles and morphological parameters that dictate the morphology and applications of soft X-ray scattering in the field of polymer semiconductors. The chapter presents a non-exhaustive survey of soft X-ray scattering studies on the basis of representative semiconducting polymeric systems, such as neat polymers, polymer:fullerene blends, polymer:nonfullerene small molecule blends, polymer:polymer blends, and ternary blend systems. It argues that the new quantitative relations established will vastly reduce the parameter space of the trial-and-error synthesis and optimization approach by clearly delineating why a particular set of materials and processing condition might fail, or which aspect may need to be improved. The chapter highlights the state-of-the-art achievements, remaining challenges, and future research developments of soft X-ray scattering.
