ABSTRACT

Photoluminescence (PL) study has been performed on the epitaxial layers of CuGaSe2 and CuAlSe2 grown by metalorganic vapor phase epitaxy (MOVPE) on CuGa0.96In0.04Se2 substrates prepared by the traveling heater method (THM). PL properties of the epilayers are compared with each other for those grown on GaAs(100), CuGa0.96In0.04Se2 (100), CuGa0.96In0.04Se2 (112) and randomly oriented CuGa0.96In0.04Se2 substrates. PL results are discussed in terms of the lattice mismatches and stresses in the epilayers.