X-Ray Powder Diffraction Data and Structural Characterization of Cu2GeS3 and Cu2SnS3.

The purpose of this work is to report the X-ray powder diffraction pattern recorded for Cu₂SnS₃ and Cu₂GeS₃, two members of the I₂ IV VI₃ family of semiconducting compounds which crystallize in the monoclinic space group Cc (No. 9) and Z=4 with a sphalerite superstructure. The unit cell parameters refined by least-squares methods were α=6.443(2)Å, b = 11.351(4)Å, c=6.414(1)Å and β=108.37(2)° for Cu₂GeS₃ and α=6.674(2)Å, b=11.584(4)Å, c=6.632(3)Å and β=109.76(2)° for Cu₂GeS₃. The results obtained in this study are analyzed in the context of the structural information previously reported for these materials.