ABSTRACT

Miargyrite (AgSbS2) and pyrargyrite (Ag3SbS3) thin films were prepared by sulphurisation of metallic precursors as well as by coevaporation. SEM measurements revealed the size of the crystallites to be dependent on the crystallinity of the substrate. Bandgaps were determined to be 2.06eV (dir.) and 1.34cV (indir.) for miargyrite and 2.26eV (dir.) for pyrargyrite thin films.