Structural and optoelectronic properties of Zn2-2xCuxInxS2 solid solution thin films

Several materials from the Zn_2–2xCu_xIn_xS₂ solid solution system were prepared as thin films on soda lime glass substrates. XRD experiments revealed that single phase films could be prepared under certain conditions. The three cation-anion bonds derived from EXAFS measurements proved to be constant over the whole composition range. Intensity and energetic position of the photoluminescence peaks were strongly dependent on x. The Cu-rich prepared and etched films showed p-type conductivity.