ABSTRACT
STEM and TEM analysis of cross-sections of the metal/oxide interface have been used to examine the transient scales (<200nm) formed on an iron-aluminium-silicon alloy. This alloy behaved differently to most alloys of its type, forming a flat adherent scale rather than a convoluted poorly adhered scale. Analysis showed that the unusual oxidation behaviour was due to the segregation of an impurity element (uranium) to the metal/oxide interface. The analysis also showed how the scale developed during the early stages of oxidation.
