ABSTRACT
Many laboratories are now equipped with electron spectrometers of high performance, giving about 0.3V energy resolution in parallel acquisition of spectra from a sub-nanometer probe. The electron energy-loss spectrum (EELS) can be regarded as containing information equivalent to that obtained from X-ray absorption spectra (XAS) using a dedicated synchrotron source. However, the EELS can be used to investigate absorption in the neighbourhood of the fundamental band-gap, as well as near-edge structure revealing the chemical state of particular ions. Furthermore, because of the high spatial resolution, the chemical state of ions in the neighbourhood of interfaces and other defects can be investigated. This opens up a whole new nanochemistry of the solid state. It goes almost without saying that either by direct imaging, or by microdiffraction techniques, the atomic structure can also be determined from the same area as the EELS. The aim of this paper is to discuss to what extent current capabilities in Electron Energy Loss Spectroscopy (EELS) supplant the facilities at major synchrotrons where the synchrotron radiation source powers several beam lines to provide XAS for a wide variety of applications.
