ABSTRACT
A selection of the many exciting opportunities for the use of atomic resolution microscopy in materials physics is presented, with an emphasis on new ideas. Schemes for exceeding the classical resolution limit in atomic resolution microscopies are summarised, including the use of atomic columns as lenses, and use of a direct solution to the dynamical inversion problem for electron microdiffraction. A summary of work aimed at deducing atomic defect structure, band-structure, formation energy and migration energy from atomic resolution images is given, and work based on video recordings of kinks on dislocations in silicon is summarised. New results for Ge growth on Si(111) are reported using our Scanning Tunnelling Atom Probe, which allows atomic clusters seen in STM images to be transferred to a time-of-flight spectrometer for identification.
