ABSTRACT
The problem of segregation and embrittlement of grain boundaries is ideally suited to demonstrating the capabilities of a high resolution analytical electron microscope (AEM). X-ray energy dispersive spectroscopy (XEDS) and electron energy loss spectroscopy (EELS) have been used to investigate the embrittling systems of Bi in Cu and S in Ni. Changes in chemistry and bonding at the nanometre level have been observed.
