ABSTRACT
Dendritic web Si solar cells and as-grown dendritic web Si ribbon have been characterized by cross-sectional TEM. Defects have been classified into: (1) the twin plane region consisting of a zone of alternating twin-related lamellae; (2) dislocations associated with the twin boundaries or the bulk of the web; and (3) impurity decoration or precipitation associated with the dislocations. These microstructures are compared for both high and low efficiency solar cells, and defect sources as well as electrical behavior are discussed.
