ABSTRACT
The aim of the present study is to utilize the nonhomogeneous Poisson or Weibull process to characterize the failure times of a system or product through the design and development stages. Such modeling for failure data of a system is referred to as reliability growth analysis. A complete formulation of the Weibull process for reliability growth analysis is given. Some of the recent developments in the subject area are also stated. Utilizing some real data on system development, we illustrate the usefulness of the methods presented.
