ABSTRACT
The authors examine the technique of model formation for the test signal of a special shape. This test signal is the base for monitoring the technical condition of electroencephalographic equipment during operation. They solve all tasks of synthesis of structural schemes and algorithms for forming a model of the test signal, and obtain structural diagrams of the algorithms for calculating the probabilistic characteristics. The authors perform a metrological analysis for the subsequent estimation of errors at each stage of data processing during the modelling of the test signal of a special shape.
