ABSTRACT
Comprehensive and integrated elucidation of the properties of sensor materials is most important for the feasibility, sensitivity, and reproducibility of sensor materials. The present chapter describes various methods to characterize the physicochemical properties of materials utilized for sensor applications. Spectroscopy techniques including X-ray diffraction, UV-visible spectrophotometric analysis, X-ray photoelectron scattering, Raman spectroscopy, and diffuse-reflectance spectroscopy for the identification of materials properties are justified in the perspective of basic principle and some urgencies for the sensor. Moreover, advanced characterization covering electrochemical-based analysis such as electrochemical impedance, potentiometry, and voltammetry analyses are also discussed.
