ABSTRACT
In this work, we describe the most common surface characterization techniques for magnetic nanomaterials. By the usage of this techniques is possible to obtain accurate information regarding to chemical, morphological, and electrical properties. The chemical characterizations described in this work included infrared (IR), Raman, and X-ray photoelectron spectroscopy (XPS), which provides information regarding to the chemical composition, crystalline structure, and chemical bonding between the atoms that built up the material. On the other hand, the morphological characterizations provide information related to the surface shape, size, aspect ratio, and topography. We discussed techniques such as Scanning Probe Microscopy, Scanning Tunneling Microscopy, and Scanning Electron Microscopy-Energy Disperse Spectroscopy. By this group of microscopy, it is possible to obtain the size of grains/particles as their aspect ratio. Finally, the Hall effect, surface resistance, and IV measurements were considered in this manuscript since they provide information related to changes in electrical properties like surface resistance or behavior of the relation current–voltage. These properties are important especially for materials applications and device fabrication.
