ABSTRACT
It has been shown that the method of thermally stimulated currents (TSC) with illumination of the sample by dosed radiant energy can provide a complete identification of the parameters of the impurity levels in high-resistivity crystals; that is, it is possible to determine not only the depth ΔE of the impurity level in the bang gap of the crystal but also to reference the depth of the level from the edge of each of the band gaps, an achievement that is not possible in the widely-used ordinary TSC-method.
