ABSTRACT
Finite Inversion Charge Layer Thickness .................... 326 7.7.3 Characterization of Extrinsic Capacitances ............................... 326
7.7.3.1 Characterization of Fringing and Overlap Capacitances .................................................................... 326
7.7.3.2 Characterization of Junction Capacitances ................. 328 7.7.4 Simulation Results and Discussion ............................................. 329
7.8 Noise Characterization ............................................................................. 331 7.8.1 Characterization of Thermal Noise in MOS Transistor ........... 332 7.8.2 Characterization of Flicker Noise in MOS Transistor ..............334
