ABSTRACT
The polarity of crystalline materials with sphalerite structure can be derived reliably from the analysis of Bragg-line contrast applying simple contrast rules. The procedure uses polarity-dependent dynamical electron scattering effects near <110> and <001> crystal projections. The contrast rules can nevertheless be applied if appropriate Bragg-lines and an appropriate sample thickness are chosen for the polarity analysis as has been demonstrated by our recent dynamical contrast simulations. The chapter summarizes new experimental results for <II 0> and <001> oriented InP samples of different thickness, and comparisons with dynamical contrast simulations. For a transfer of the polarity information from the diffraction pattern to a real space image, a possible relative rotation between the image and the diffraction pattern has to be taken into account.
