ABSTRACT

This chapter discusses the physics, fundamental limitations, and applications of the amorphous devices. The most attractive application of hydrogenated amorphous silicon (a-Si:H) electronic devices is in an active matrix. The chapter describes both the state-of-the-art technologies and performance of a-Si:H devices, and various technological trends aimed at achieving still further improvement. One-dimensional analytical theories are sufficient to grasp fundamental device physics, while two-dimensional numerical results give a design guide for high-performance and short-channel field-effect transistors (FETs). The most important parameter in a-Si:H FET characteristics, from the viewpoint of applications, is their on- and off-current, ION and IOFF. ION and IOFF are drain currents when the gate voltage takes the maximum and minimum values, respectively, and depend on operating conditions. Many experimental results on the static performance of a-Si:H FETs have been obtained. These accumulated results gradually have clarified relations between FET performance and fabrication conditions and have identified remaining problems as well.