ABSTRACT
Atomic force microscopy (AFM) belongs to the family of scanning probe microscopy. It is not a technique based on electron microscopy. It has been normal practice in the last couple of years to supplement electron microscopy with AFM as it provides clear surface characterization of polymers, blends, nanoparticles, and nanocomposites. In this chapter, we are mainly focusing on different modes of operations of AFM and their applications in the area of polymers and their blends and nanocomposites.
