ABSTRACT
A. X-Ray Characterization Traditionally, x-ray diffraction techniques are used to establish the crystalline periodicity (periodicities) from the Bragg reflections and the crystallite sizes from the Bragg linewidths. In the case of GICs, the dominant periodicity is the staging periodicity normal to the layer planes. Typically, the staging behavior is characterized by 0 — 20 x-ray diffraction scans to determine the oaxis repeat distance Ic and the staging fidelity.
